NanoWorld research activities - AFM probes for non-standard applications

14.02.2014, 14:00

Thomas Sulzbach (Head of Research and Development, Nanoworld Services GmbH)

Organizer:
Sandoghdar Division
 
Speaker:

Thomas Sulzbach
(Head of Research and Development, Nanoworld Services GmbH)
 
Title:
NanoWorld research activities - AFM probes for non-standard applications
 
Abstract:
Today atomic force microscopy is used in a wide field of applications. Besides standard applications like topography and roughness measurements a large scope of material properties like mechanical, electrical, optical or chemical informations could be collected at the nanometer scale. These non-standard AFM applications require individual tailored AFM probes. This talk will give an overview about our research activities for AFM probes used in these non-standard applications.
 
Time and Place:
February 14th (Friday) at 14:00
Large Seminar Room (429/435), Bldg. 24